Download Advanced Dielectric, Piezoelectric and Ferroelectric Thin by Bruce A. Tuttle, Chonglin Chen, Quanxi Jia, R. Ramesh PDF

By Bruce A. Tuttle, Chonglin Chen, Quanxi Jia, R. Ramesh

Advances in synthesis and characterization of dielectric, piezoelectric and ferroelectric skinny motion pictures are incorporated during this quantity. Dielectric, piezoelectric and ferroelectric skinny motion pictures have a massive impression on numerous advertisement and armed forces platforms together with tunable microwave units, stories, MEMS units, actuators and sensors. fresh paintings on piezoelectric characterization, AFE to FE dielectric part transformation dielectrics, resolution and vapor deposited skinny movies, and fabrics integration are one of the subject matters integrated. Novel methods to nanostructuring, characterization of fabric houses and actual responses on the nanoscale is also included.Content:

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Additional info for Advanced Dielectric, Piezoelectric and Ferroelectric Thin Films, Volume 162

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L — - J l 20 1 4» Electric Field (kV/cm) Figure 4, The interdigital dielectric property measurement showing the film have a very large dielectric tunability value of 48% at room temperature SUMMARY Dielectric PSTO thin films have been epitaxially grown on (001) LAO by pulsed laser deposition. Microstructure studies reveal that the as-grown films have excellent single crystallinity and epitaxial behavior. The interface relationship was determined to be [100]PSTO // [100]LAO and (001)PSTO // (OOl)LAO.

0 rh \S L rfär 1 -10 i i. »20 , . i . , — L — - J l 20 1 4» Electric Field (kV/cm) Figure 4, The interdigital dielectric property measurement showing the film have a very large dielectric tunability value of 48% at room temperature SUMMARY Dielectric PSTO thin films have been epitaxially grown on (001) LAO by pulsed laser deposition. Microstructure studies reveal that the as-grown films have excellent single crystallinity and epitaxial behavior. The interface relationship was determined to be [100]PSTO // [100]LAO and (001)PSTO // (OOl)LAO.

427-430 4 J. D. Baniecki, R. B. Laibowitz, T. M. Shaw, C. Parks, J. Lian, H. Xu Q. Y. xSrxTi03/Pt thin film capacitors, J. Appl. Phys. vol. 89, pp. 2873-2885,2001. 5 K. Kurihara, T. Shioga, J. D. Baniecki, "Electrical properties of low-inductance barium strontium titanate thin film decoupling", Journal of the European Ceramic Society, 24 1873-1876 (2004). D. Baniecki, T. Shioga, K. Kurihara, N. Kamehara, "Investigation of the importance of interface and bulk limited transport mechanisms on the leakage current of high dielectric constant thin film capacitors", J.

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